Exciting News! Nova and Samsung's collaborative paper has won the prestigious Vladimir Ukraintsev Award for Collaborations in Metrology at SPIE! This achievement highlights our commitment to advancing metrology and process control through research collaboration with our customers and leveraging of innovative technologies. Kudos to Lior Neeman and Noga Meir, Applications Team Leaders at Nova, for their outstanding contributions! Click Here to Read More: https://lnkd.in/d93C_Ve4 #Innovation #Metrology #AI #SPIE #NovaTech
Head of Global Talent Acquisition - Nova
2wNoga Meir Lior Neeman - Kudos!!! Hadas Eliasi 🎗