AMCAD’s Post

What makes Pulsed IV measurements essential when working with high-power GaN transistors? That’s the question we addressed in our recent webinar, co-hosted by Florentin Renault (AMCAD) and Maxime Faure (Dassault Systèmes). Through technical insights and practical demonstrations, we explored how Pulsed IV techniques help: ➡ Reduce self-heating for more stable testing ➡ Avoid trapping effects that impact modeling accuracy ➡ Enable quasi-isothermal measurements by carefully controlling pulse profiles The session also included a look at how SIMULIA IVCAD Suite 4.0 and AMCAD SAS hardware can be used together in a lab environment for integrated, precise transistor characterization. #GaN #PulsedIV #RFMeasurements #TransistorCharacterization #IVCAD #AMCAD #SIMULIA #WebinarReplay